9031.41.00
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
This code covers instruments and appliances used for inspecting semiconductor wafers, devices, or photomasks/reticles used in their manufacturing. Classified within Chapter 90 for measuring and checking instruments, these goods generally enter the US duty-free, particularly those sourced from standard trade partners or eligible FTA countries.

Detailed information for HTS Code 9031.41.00
This code falls within the broader category of optical, photographic, cinematographic, measuring, checking, precision, medical, or surgical instruments and apparatus. Specifically, 9031.41.00 covers instruments used for inspecting semiconductor wafers, devices (including integrated circuits), or the photomasks and reticles used in their manufacturing. Further breakdown exists to specify if the instrument is for inspecting photomasks/reticles (9031.41.00.20), semiconductor wafers specifically for wafers (9031.41.00.40), or other wafer inspection purposes (9031.41.00.60). When reporting, choose the statistical suffix that most accurately reflects the type of inspection instrument being imported.
| Chapter | Chapter 90 - Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instrume |
| Section | Section XVIII - Optical, Photographic, Cinematographic, Measuring, Checking, Precision, Medical or Surgical Instrume |
Duty snapshot
Quick reference for the duty outcomes tied to this HTS line.
Free
Standard trade partners (NTR)
N/A
Eligible FTA or preference programs
The general duty rate for HTS code 9031.41.00 and its subdivisions (9031.41.00.20, 9031.41.00.40, and 9031.41.00.60) is Free, meaning no duty is assessed on goods falling under this code from standard trade partners. Special rates are not specified, but eligibility for Free Trade Agreements or other preference programs may offer reduced or eliminated duties—details would depend on the country of origin and specific agreement. There are no report units specified for this HTS code. This duty structure applies uniformly to all subdivisions, meaning the same duty treatment applies whether the item is for inspecting photomasks, wafers, or other semiconductor components.
Rate of Duty (Column 2): 50%
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Code subdivisions
9031.41.00.20
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other optical instruments and appliances: > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting photomasks or reticles used in manufacturing semiconductor devices
9031.41.00.40
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other optical instruments and appliances: > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting semiconductor wafers or devices: > For wafers
9031.41.00.60
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other optical instruments and appliances: > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting semiconductor wafers or devices: > Other
Chapter & section notes
Chapter notes
Section notes
Latest update
Last updated
November 15, 2025
Revised every January & July
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